Failure Mechanisms


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Failure Mechanisms
Failure Mechanisms
Terminology in electronics failure analysis The terminology used in the failure analysis of electronic devices and materials is somewhat different from that used in other kinds of failure analyses. In this context, failure mode refers to the nature of malfunction of the device, which results in the observed failure characteristic (e.g., open circuit, short circuit, leakage). The nature of the actual fault that causes the device to malfunction is called the failure defect (e.g., microcracks and growths). Phenomena such as electromigration and corrosion that produce failure defects are called the failure mechanisms.
Citation
Charlie R. Brooks; Ashok Choudhury: Failure Analysis of Engineering Materials. Failure Mechanisms, Chapter (McGraw-Hill Professional, 2002), AccessEngineering Export