Nanoscale CMOS VLSI Circuits: Design for Manufacturability
by: Sandip Kundu, Aswin Sreedhar
Abstract: Cutting-edge Design for Manufacturability Techniques for Nanoscale CMOS VLSI Circuits Covering defect analysis, equipment, and lithographic control evaluations, this book offers a holistic approach for VLSI circuit designers to evaluate and analyze IC circuit designs from the manufacturability point of view. This practical guide is ideal for design engineers, managers, students, and academics interested in understanding the sources of semiconductor chip failures and how these problems can be mitigated through design.
Full details
Table of Contents
- A. About the Authors
- B. Preface
- 1. Introduction
- 2. Semiconductor Manufacturing
- 3. Process and Device Variability: Analysis and Modeling
- 4. Manufacturing-Aware Physical Design Closure
- 5. Metrology, Manufacturing Defects, and Defect Extraction
- 6. Defect Impact Modeling and Yield Improvement Techniques
- 7. Physical Design and Reliability
- 8. Design for Manufacturability: Tools and Methodologies
Tools & Media
Expanded Table of Contents
-
A.
About the Authors
-
B.
Preface
- 1. Introduction
- 2. Semiconductor Manufacturing
- 3. Process and Device Variability: Analysis and Modeling
- 4. Manufacturing-Aware Physical Design Closure
- 5. Metrology, Manufacturing Defects, and Defect Extraction
- 6. Defect Impact Modeling and Yield Improvement Techniques
- 7. Physical Design and Reliability
- 8. Design for Manufacturability: Tools and Methodologies
Book Details
Title: Nanoscale CMOS VLSI Circuits: Design for Manufacturability
Publisher: : New York, Chicago, San Francisco, Lisbon, London, Madrid, Mexico City, Milan, New Delhi, San Juan, Seoul, Singapore, Sydney, Toronto
Copyright / Pub. Date: 2010 The McGraw-Hill Companies, Inc
ISBN: 9780071635196
Authors:
Sandip Kundu
is a professor in the Electrical and Computer Engineering Department at the University
of Massachusetts at Amherst, specializing in semiconductor and lithographic manufacturing.
Aswin Sreedhar
is a research assistant at the Electrical and Computer Engineering Department at the
University of Massachusetts.
Description: Cutting-edge Design for Manufacturability Techniques for Nanoscale CMOS VLSI Circuits Covering defect analysis, equipment, and lithographic control evaluations, this book offers a holistic approach for VLSI circuit designers to evaluate and analyze IC circuit designs from the manufacturability point of view. This practical guide is ideal for design engineers, managers, students, and academics interested in understanding the sources of semiconductor chip failures and how these problems can be mitigated through design.
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