Photodetection and Measurement: Maximizing Performance in Optical Systems
by: Mark Johnson
Abstract: Photodetection and measurement techniques are used by engineers and physicists to “characterize" optical devices and systems. Characterizing – numerically describing a device’s performance – is vital to the design and analysis of fiber optics, laser systems, and opto-electronic circuitry. As more and more of electronics are becoming opto-electronic (because light moves faster then electricity) the art of taking accurate, inexpensive optical measurements has become very important to EEs across the board.This is a practical engineering tutorial on making accurate and effective measurements without spending a fortune – by using equipment commonly available in labs and companies. It considers the full chain of equipment: photodetectors, amplifiers, LED sources, electronic drives, basic optics, interference screens, and data acquisition systems. MathCAD will be used for frequency plots throughout.
Full details
Table of Contents
- A. Preface
- 1. Photodetection Basics
- 2. Amplified Detection Circuitry
- 3. Fundamental Noise Basics and Calculations
- 4. Interlude: Alternative Circuits and Detection Techniques
- 5. System Noise and Synchronous Detection
- 6. Useful Electronic Circuits and Construction Techniques to Get You Going
- 7. Control of Ambient Light
- 8. Stability and Tempco Issues
- 9. Contamination and Industrial Systems
- 10. Measurand Modulation
- B. Multiple Channel Detection
- A. Calculations of Simple RC, LC Networks Using Complex Frequency Notation
- B. What Does the Spectrum Analyzer Measure
- C. Bluff Your Way in Digital Signal Processing
- D. The Weighing Design Problem
- E. References
Tools & Media
Expanded Table of Contents
-
A.
Preface
- 1. Photodetection Basics
- 2. Amplified Detection Circuitry
-
3.
Fundamental Noise Basics and Calculations
- Introduction
- Shot Noise
- Photon Statistics
- What Shot Noise Can We Expect?
- Thermal (Johnson) Noise
- Bias Box Noise
- (Operational) Amplifier Equivalent Noise Sources
- Discrete Active Component Equivalent Noise Sources
- Design Example: Free-Space Detection of an LED—Big (Resistor) is Better
- TRY IT! Another Attempt at Visible Shot Noise Measurements
- Dynamic Noise Performance
- Noise and Signal-to-Noise Measurement
- Summary
- 4. Interlude: Alternative Circuits and Detection Techniques
- 5. System Noise and Synchronous Detection
- 6. Useful Electronic Circuits and Construction Techniques to Get You Going
- 7. Control of Ambient Light
- 8. Stability and Tempco Issues
- 9. Contamination and Industrial Systems
- 10. Measurand Modulation
- B. Multiple Channel Detection
- A. Calculations of Simple RC, LC Networks Using Complex Frequency Notation
- B. What Does the Spectrum Analyzer Measure
- C. Bluff Your Way in Digital Signal Processing
-
D.
The Weighing Design Problem
-
E.
References
Book Details
Title: Photodetection and Measurement: Maximizing Performance in Optical Systems
Publisher: McGraw-Hill: New York, Chicago, San Francisco, Lisbon London, Madrid, Mexico City, Milan, New Delhi, San Juan, Seoul, Singapore, Sydney, Toronto
Copyright / Pub. Date: 2003 The McGraw-Hill Companies, Inc.
ISBN: 9780071409445
Authors:
Mark Johnson is the author of this McGraw-Hill Professional publication.
Description: Photodetection and measurement techniques are used by engineers and physicists to “characterize" optical devices and systems. Characterizing – numerically describing a device’s performance – is vital to the design and analysis of fiber optics, laser systems, and opto-electronic circuitry. As more and more of electronics are becoming opto-electronic (because light moves faster then electricity) the art of taking accurate, inexpensive optical measurements has become very important to EEs across the board.This is a practical engineering tutorial on making accurate and effective measurements without spending a fortune – by using equipment commonly available in labs and companies. It considers the full chain of equipment: photodetectors, amplifiers, LED sources, electronic drives, basic optics, interference screens, and data acquisition systems. MathCAD will be used for frequency plots throughout.
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