Industrial Engineering

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Today's Industrial Engineering news

Extraction Challenges Grow in Advanced Nanometer IC Design

Source: EE Times
Date: 29/05/2015 20:56:31

FHWA Collects State DOT Data To Build New Bridge Inspection System

Source: Engineering News-Record
Date: 29/05/2015 20:16:03

This OS Almost Made Apple an Entirely Different Company

Source: Wired News
Date: 29/05/2015 20:09:01

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